The Changes of Structure and Electrical Properties of Thin Films During Long-Term Aging

Array

Authors

  • B.P. Yatsyshyn
  • N.I. Domantsevych Lviv University of Trade and Economics

DOI:

https://doi.org/10.15330/pcss.18.2.184-186

Keywords:

thin films, aging, electron microscopy

Abstract

The changes of surface structure and electrical properties of crystalline thin films of ternary compounds (La, Y, Sc)-(Ni, Fe)-Ge with metal content not more than 50 at. percent, which are obtained by vacuum deposition, are investigated. The directions of growth defects of films in aging over 20 years shown also as the influence of aging on the electrical properties of the condensates are analyzed.

References

[1] D.M. Freik, B.P. Yatsyshyn, Physics and Chemistry of Solid State 8 (1), 7 (2007).
[2] B.P. Yatsyshyn, Materials and technologies of amorphous and nanostructured films based on RE germanides (Publisher Lviv Commercial academy, Lviv, 2008).
[3] L.S. Palatnik, I.I. Papyrov, Epitaxial thin films (Metallurgy, Moscow, 1970).
[4] L.S. Palatnik, I.I. Papyrov, Oriented crystallization (Metallurgy, Moscow, 1967).
[5] E.I. Tochitskiy, Crystallization and annealing of thin films (Minsk, 1976).

Published

2017-06-15

How to Cite

Yatsyshyn, B., & Domantsevych , N. (2017). The Changes of Structure and Electrical Properties of Thin Films During Long-Term Aging: Array. Physics and Chemistry of Solid State, 18(2), 184–186. https://doi.org/10.15330/pcss.18.2.184-186

Issue

Section

Scientific articles