Investigation of The Effect of Annealing on Resistivity in Aluminum-based Amorphous Alloys

Array

Authors

  • S. Kerli Energy System Engineering Department, Kahramanmaras İstiklal University
  • Ü. Alver Department of Metallurgical and Materials Engineering, Karadeniz Technical University
  • M. Gögebakan Department of Physics, Faculty of Science and Letter, Kahramanmaras Sutcu Imam University

DOI:

https://doi.org/10.15330/pcss.20.4.391-395

Keywords:

amorphous alloy, crystallization, electrical resistivity

Abstract

In this study, electrical properties of Al-Y-Ni alloys produced by melt-spinning method were investigated. Before annealing, XRD analyzes were performed and the samples were found to be amorphous. Exothermic peaks were observed in DSC measurements and crystallization stages of the alloys were determined. Al85Y11Ni4, Al85Y10Ni5 and Al85Y5Ni10 samples were annealed at some temperature and their electrical resistivity was measured by four-point method. The large decrease in resistivity was observed during crystallization between 200 - 400 ˚C. These results were consistent with XRD and DSC measurements.

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Published

2019-12-15

How to Cite

Kerli, S., Alver, Ü., & Gögebakan, M. (2019). Investigation of The Effect of Annealing on Resistivity in Aluminum-based Amorphous Alloys: Array. Physics and Chemistry of Solid State, 20(4), 391–395. https://doi.org/10.15330/pcss.20.4.391-395

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Scientific articles